Method and system for avoiding package induced failure in swept semiconductor source

ABSTRACT

Dry oxygen, dry air, or other gases such as ozone are hermetically sealed within the package of the external cavity laser or ASE swept source to avoid packaging-induced failure or PIF. PIF due to hydrocarbon breakdown at optical interfaces with high power densities is believed to occur at the SLED and/or SOA facets as well as the tunable Fabry-Perot reflector/filter elements and/or output fiber. Because the laser is an external cavity tunable laser and the configuration of the ASE swept sources, the power output can be low while the internal power at surfaces can be high leading to PIF at output powers much lower than the 50 mW.

RELATED APPLICATIONS

This application claims the benefit under 35 USC 119(e) of U.S.Provisional Application No. 61/467,312, filed on Mar. 24, 2011, which isincorporated herein by reference in its entirety.

BACKGROUND OF THE INVENTION

Optical coherence analysis relies on the use of the interferencephenomena between a reference wave and an experimental wave or betweentwo parts of an experimental wave to measure distances and thicknesses,and calculate indices of refraction of a sample. Optical CoherenceTomography (OCT) is one example technology that is used to performhigh-resolution cross sectional imaging. It is often applied to imagingbiological tissue structures, for example, on microscopic scales in realtime. Optical waves are reflected from an object or sample and acomputer produces images of cross sections of the sample by usinginformation on how the waves are changed upon reflection.

Fourier domain OCT (FD-OCT) currently offers the best performance formany applications. Moreover, of the Fourier domain approaches,swept-source OCT has distinct advantages over techniques such asspectrum-encoded OCT because it has the capability of balanced andpolarization diversity detection. It has advantages as well for imagingin wavelength regions where inexpensive and fast detector arrays, whichare typically required for spectrum-encoded FD-OCT, are not available.

In swept source OCT, the spectral components are not encoded by spatialseparation, but they are encoded in time. The spectrum is eitherfiltered or generated in successive frequency steps and reconstructedbefore Fourier-transformation. Using the frequency scanning sweptsource, the optical configuration becomes less complex but the criticalperformance characteristics now reside in the source and especially itsfrequency tuning speed and accuracy.

High speed frequency tuning for OCT swept sources is especially relevantto in vivo imaging where fast imaging reduces motion-induced artifactsand reduces the length of the patient procedure. It can also be used toimprove resolution.

The swept sources for OCT systems have typically been tunable lasers.The advantages of tunable lasers include high spectral brightness andrelatively simple optical designs. A tunable laser is constructed from again medium, such as a semiconductor optical amplifier (SOA), which islocated within a resonant cavity, and a tunable element such as arotating grating, grating with a rotating mirror, or a Fabry-Perottunable filter. Currently, some of the highest tuning speed lasers arebased on the designs described in U.S. Pat. No. 7,415,049 B1, entitledLaser with Tilted Multi Spatial Mode Resonator Tuning Element, by D.Flanders, M. Kuznetsov and W. Atia. The use of micro-electro-mechanicalsystem (MEMS) Fabry-Perot tunable filters combines the capability forwide spectral scan bands with the low mass, high mechanical resonantfrequency deflectable MEMS membranes that have the capacity for highspeed tuning.

Another class of swept sources that have the potential to avoid some ofthe inherent drawbacks of tunable lasers, such as sweep speedlimitations, is filtered amplified spontaneous emission (ASE) sourcesthat combine a spectrally broadband light source, typically a sourcethat generates light by ASE such as a superluminescent light emittingdiode (SLED), with tunable optical filters and optical amplifiers. Someof the highest speed, and most integrated devices based on filtered ASEsources are described in U.S. Pat. No. 7,061,618 B2, entitled IntegratedSpectroscopy System, by W. Atia, D. Flanders P. Kotidis, and M.Kuznetsov. A number of variants of the filtered ASE swept source aredescribed, including amplified versions and versions with trackingfilters. More recently, U.S. Pat. Appl. Publ. No. 2011/0051143 A1, filedon May 8, 2010, entitled ASE Swept Source with Self-Tracking Filter forOCT Medical Imaging, by D. Flanders, W. Atia, and M. Kuznetsov, which isincorporated herein in its entirety by this reference, lays out variousintegrated, high speed filtered ASE swept source configurations,including self-tracking filters.

SUMMARY OF THE INVENTION

A common wavelength for OCT swept sources is centered on 1060 nanometers(nm). The SLED's and SOA's in this wavelength are typically fabricatedfrom GaAs chips. These chips often cover a range including 970-1100 nm.

While the swept sources for OCT applications are often relatively lowpower devices, having output powers of less than 50 milliWatts (mW) ofoutput optical power, experience has demonstrated that failures occur.It is believed that these failures are packaging induced failures (PIF).

In current tunable lasers, getters are used to capture, e.g.,absorb/adsorb, moisture. Currently, the getters do not absorb hydrogenor hydrocarbons.

Despite the fact that the optical output is less than 50 mW, such as30-40 mW, or less, the optical power seen by optical elements within thelasers or ASE swept sources are higher, typically two to three timeshigher. This is due to the external cavity configuration in the case ofthe lasers since light resonates within the cavity and only a portion ofthat light present as output optical power. In the case of the ASE sweptsources, light may circulate through loops or stubs.

Still higher powers are present in any resonant filter elements. Theratio of the optical power inside a Fabry Perot filter versus outsidethe filter is roughly the same as the finesse of the filter, which istypically in the range 500-5000. The optical mode diameter is typicallyon the order of 1-2 micrometers in diameter at the facet of a laserdiode, SLED, or SOA, and on the order of 10-20 micrometers diameter in amicroelectromechanical (MEMS) Fabry Perot tunable filter. Thus the spotarea is roughly 100 times higher inside the FP filter cavity.

This means the optical power density inside the FP cavity can be 10-100times higher than the facet of a laser diode, SLED, or SOA at the sameoverall device output optical power, as is otherwise present in theexternal cavity laser.

Therefore, the same type of failure mechanism as seen on high power 980nm pump lasers at greater than 50 mW can also take place in an externalcavity laser, ASE swept source, and/or MEMS tunable filter, even withsources that generate less than 50 mW of optical power.

According to the invention, dry oxygen, dry air, or other gases such asozone are hermetically sealed within the package of the external cavitylaser or ASE swept source to avoid packaging-induced failure or PIF. PIFdue to hydrocarbon breakdown at optical interfaces with high powerdensities. It can occur at the SLED and/or SOA facets as well as thetunable Fabry-Perot reflector/filter elements and/or output fiber.Because the laser is an external cavity tunable laser and theconfiguration of the ASE swept sources, the power output can be lowwhile the internal power at surfaces can be high leading to PIF atoutput powers much lower than the 50 mW. The oxygen will combine withany free carbon in the package to avoid its deposition on any opticalsurfaces that transmit or reflect light.

In one embodiment, the oxygen content within the package is about 20%,or preferably between 10-50%.

In other embodiments, PIF is minimized by exposing the hermetic packageto an ozone cleaning prior to lid sealing to eliminate trace organics.Further, the packages are preferably baked at 200 C-250 C for roughly100 hrs to drive out residual hydrogen from the package during themanufacturing process. Hydrogen can be problematic when lid sealing withoxygen present, since it combines with the oxygen to produce internalmoisture. Moisture in the presence of oxygen will result in corrosion,especially of metal joints, such as certain solders and thermo-electriccoolers.

In a further embodiment, in addition to a moisture getter to reduce theinternal moisture, the getter or an additional getter is used to reducehydrogen and/or volatile organics.

In the current embodiment, the tunable laser or ASE swept sourcecomprises a semiconductor gain medium, such as an SOA, and a tuningelement such as a MEMS Fabry-Perot tunable filter for controlling afrequency of the tunable swept optical signal. The tunable source islocated in a hermetic package with provisions for absorbing any carbonor carbon species. This is accomplished using oxygen in the package,which combines with carbon to produce carbon dioxide, and/or carbongetters.

In other embodiments, such as the case of a tunable vertical cavitysurface emitting laser (VCSEL), the laser cavity may be very short, onthe order of 1-10 micrometers. In this case as well, there are multipleair-to-solid interfaces inside the optical cavity which are potentiallyimpacted by the degradation mechanism leading to PIF.

In general, according to another aspect, the invention features a methodfor configuring an optical coherence tomography system. The methodcomprises providing a swept source that includes a hermetic package, anoptical bench within the hermetic package, a semiconductor gain chipinstalled on the optical bench for generating light, and a tunablefilter installed on the bench for filtering the light from thesemiconductor gain chip to generate a swept optical signal. The hermeticpackage is filled with an atmosphere that contains oxygen and a sweptoptical signal generated with the swept source. The signal istransmitted an interferometer.

The above and other features of the invention including various noveldetails of construction and combinations of parts, and other advantages,will now be more particularly described with reference to theaccompanying drawings and pointed out in the claims. It will beunderstood that the particular method and device embodying the inventionare shown by way of illustration and not as a limitation of theinvention. The principles and features of this invention may be employedin various and numerous embodiments without departing from the scope ofthe invention.

BRIEF DESCRIPTION OF THE DRAWINGS

In the accompanying drawings, reference characters refer to the sameparts throughout the different views. The drawings are not necessarilyto scale; emphasis has instead been placed upon illustrating theprinciples of the invention. Of the drawings:

FIG. 1 is a top perspective view of an external cavity tunable laserswept source for optical coherence analysis according to a firstembodiment the present invention in which the lid is cut-away to showthe other components;

FIG. 2 is a top perspective view of an ASE swept source for opticalcoherence analysis according to a second embodiment the presentinvention in which the lid is cut-away to show the other components;

FIG. 3 is a schematic view of an OCT system incorporating the sweptsource according to an embodiment of the invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 shows an external cavity tunable laser swept source 100 foroptical coherence analysis, which has been constructed according to theprinciples of the present invention.

In the current embodiment, the laser swept source 100 is preferably alaser as generally described in incorporated U.S. Pat. No. 7,415,049 B1.It includes a linear cavity with a gain element and a Fabry-Perot filterfrequency tuning element defining one end of the cavity. Currently, thewavelength for OCT tunable laser is centered roughly on 1060 nanometers(nm) and tunes over about 970-1100 nm.

In other embodiments, other cavity configurations are used such as ringcavities. Further other cavity tuning elements are used such asgratings. These elements can also be located entirely within the cavitysuch as an angle isolated Fabry-Perot tunable filter or grating.

In more detail with respect to the illustrated embodiment, the tunablelaser 100 comprises an edge-emitting semiconductor gain chip 410 that ispaired with a micro-electro-mechanical (MEMS) angled reflectiveFabry-Perot tunable filter 412, which defines one end of the lasercavity. The cavity extends to a second output reflector that is locatedin the package or in fiber pigtail 320 that is coupled to the bench Band also forms part of the cavity.

Light passing through the output reflector is transmitted on opticalfiber 320 or via free space to an interferometer 50 of the OCT systemdescribed below.

The semiconductor optical amplifier (SOA) chip 410 is located within thelaser cavity. In the current embodiment, input and output facets of theSOA GaAs chip 410 are angled and anti-reflection (AR) coated, providingparallel beams from the two facets. In the preferred embodiment, the SOAchip 410 is bonded or attached to the common bench B via a submount.

Each facet of the SOA 410 has an associated lens structure 414, 416 thatis used to couple the light exiting from either facet of the SOA 410.The first lens structure 414 couples the light between the back facet ofthe SOA 410 and the reflective Fabry-Perot tunable filter 412. Lightexiting out the output or front facet of the SOA 410 is coupled by thesecond lens structure 416 to a fiber end facet of the pigtail 320.

Each lens structure comprises a LIGA mounting structure, which isdeformable to enable post installation alignment, and a transmissivesubstrate on which the lens is formed. The transmissive substrate istypically solder or thermocompression bonded to the mounting structure,which in turn is solder bonded to the optical bench B.

The fiber facet of the pigtail 320 is also preferably mounted to thebench B via a fiber mounting structure, to which the fiber 320 is solderbonded. The fiber mounting structure is likewise usually solder bondedto the bench B.

The angled reflective Fabry-Perot filter 412 is a multi-spatial-modetunable filter that provides angular dependent reflective spectralresponse back into the laser cavity. This characteristic is discussed inmore detail in incorporated U.S. Pat. No. 7,415,049 B1.

Preferably, the tunable filter 412 is a Fabry-Perot tunable filter thatis fabricated using micro-electro-mechanical systems (MEMS) technologyand is attached, such as directly solder bonded, to the bench B.Currently, the filter 412 is manufactured as described in U.S. Pat. Nos.6,608,711 or 6,373,632, which are incorporated herein by this reference.A curved-flat resonator structure is used in which a generally flatmirror and an opposed curved mirror define a filter optical cavity, theoptical length of which is modulated by electrostatic deflection of atleast one of the mirrors.

In another implementation, a tunable VCSEL technology is used in thetunable laser 100. In such cases, the filter 412 or deflectable MEMSmembrane is integrated together with the gain chip 410 that is avertical surface emitting laser chip. Often these devices are opticallypumped. In such cases, a pump laser diode is further integrated on thebench B.

The tunable laser 100 on the bench B is installed within a hermeticpackage 500.

The laser swept source 100 and the other embodiments discussedhereinbelow are generally intended for high speed tuning to generate atunable or swept optical signal that scans over the scanband at speedsgreater than 10 kiloHertz (kHz). In current embodiments, the laser sweptsource 100 tunes at speeds greater than 50 or 100 kHz by tuning thetunable filter 412. In very high speed embodiments, the laser sweptsource 100 tunes at speeds greater than 200 or 500 kHz, or faster.

The tuning speed can also be expressed in wavelength per unit time. Inone example, for an approximately 110 nm tuning range or scan bandaround 1060 nm and 100 kHz scan rate, assuming 60% duty cycle forsubstantially linear up-tuning, the peak sweep speed would be 110 nm*100kHz/0.60=18,300 nm/msec=18.3 nm/μsec or faster. In another example, foran approximately 90 nm tuning range and 50 kHz scan rate, assuming a 50%duty cycle for substantially linear up-tuning, the peak sweep speed is90 nm*50 kHz/0.50=9,000 nm/msec=9.0 nm/μsec or faster. In a smaller scanband example having an approximately 30 nm tuning range and 2 kHz scanrate, assuming a 80% duty cycle for substantially linear tuning, thepeak sweep speed would be 30 nm*2 kHz/0.80=75 nm/msec=0.075 nm/μsec, orfaster.

Thus, in terms of scan rates, in the preferred embodiments describedherein, the sweep speeds are greater than 0.05 nm/μsec, and preferablygreater than 5 nm/μsec. In still higher speed applications, the scanrates are higher than 10 nm/μsec.

The bench B is termed a micro-optical bench and is preferably less than10 millimeters (mm) in width and about 25 mm in length or less. Thissize enables the bench to be installed in a standard, or nearstandard-sized, butterfly or DIP (dual inline pin) hermetic package 500.In one implementation, the bench B is fabricated from aluminum nitride.A thermoelectric cooler 502 is disposed between the bench B and thepackage 500 (attached/solder bonded both to the backside of the benchand inner bottom panel of the package) to control the temperature of thebench B. The bench temperature is detected via a thermistor 430installed on the bench B.

Dry oxygen, or other gases such as ozone, is sealed within the hermeticpackage 500 of the external cavity laser 100 to avoid packaging-inducedfailure (PIF). The gas or gases are added during the process of lidsealing where the lid 501 is sealed on the package 500. PIF due tohydrocarbon breakdown at optical interfaces with high power densities isbelieved to occur at the SOA facets as well as the tunable Fabry-Perotreflector/filter elements 412 and micro lens elements 414, 416 and/orthe facet of the output fiber 320.

In one embodiment, the oxygen content within the package is about 20%,or preferably between 10-50%.

In other embodiments, PIF is minimized by exposing the hermetic package500 to an ozone cleaning prior to lid sealing to eliminate traceorganics. Further, the packages are preferably baked at 200 C-250 C forroughly 100 hrs to drive out residual hydrogen from the packagemanufacturing process. Hydrogen can be problematic when lid sealing withoxygen present, since it combines with the oxygen to produce internalmoisture. Moisture in the presence of oxygen will result in corrosion,especially of metal joints, like solders and Thermo-electric coolers.

A moisture getter 432 is included in the package 500. In one embodiment,it is applied to the bottom of the lid 501 or within the package in someother form, such as pellets, to reduce the internal moisture. In someexamples, the getter or another getter is used to reduce hydrogen and/orvolatile organics and is also applied to the inside of the lid 501 orelsewhere inside the package.

The present invention is also relevant to other types of swept sourcesincluding non-laser sources.

FIG. 2 shows a non-laser swept source 100 for optical coherenceanalysis, which has been constructed according to the principles of thepresent invention.

The specific illustrated example is a swept source 100 withcontra-directional self tracking filter using polarization diversity anda loop amplification stage. It shows the coupling optics, lenses, thatare used to couple the optical signal in and out of the elements on thebench B and the installation of the bench in a hermetic package 500. Thelid 501 of the package 500 is cutaway to expose the optical elements.

The edge-emitting broadband source 112 generates the broadband signal.In the illustrated embodiment, the broadband source 112 is implementedas a semiconductor gain chip such as a super luminescent light emittingdiode (SLED) or SOA implemented as a SLED. In the illustrated example,the semiconductor gain chip is secured to a submount 710, which isbonded to the bench B. The light exiting from the broadband source 112is collimated by a first lens component 712. As described previously,the lens components preferably comprise lens substrates that are bondedto mounting structures, which in turn are mounted to the bench B.

The broadband signal then is transmitted through an isolator 310. Thisprevents back reflections into the broadband source 112 and thus lasing.

The typically horizontally polarized light from the broadband source 112is transmitted through the PBS 120. A MEMS Fabry-Perot tunable filter150, as described previously see reference number 412 of FIG. 1, thenconverts the broadband signal 114 into the narrowband tunable signal ina transmissive implementation. A loop PBS 610 transmits the tunablesignal to a first loop isolator 612. A second lens component 720 couplesthe tunable optical signal into SOA semiconductor gain chip 174 which isthe optical amplifier in the loop. The SOA 174 is preferably mountedonto the bench 110 by a submount 725.

Light exiting the SOA 174 is collimated by a third lens component 722 inthe loop. Two subsequent fold mirrors 614 and 616 redirect the tunableswept optical signal. The tunable optical signal is then transmittedthrough a second loop isolator 618 and two lens components: a fourthlens component 724 and a fifth lens component 726. A fold mirror 620returns the tunable optical signal to the loop PBS 610. The second loopisolator 618 rotates the polarization of the tunable optical signal by90° from horizontal to vertical polarization. As a result, the tunableoptical signal received by the loop PBS 610 is reflected back to thetunable filter 150.

The tunable optical filter 150 again filters the tunable optical signal154 applying its bandpass filter function. In passing through thetunable filter 150 this second time, light is propagating in theopposite direction and with orthogonal polarization to the firstpassage. The vertical polarization of the tunable optical signal fromthe tunable filter is reflected by the PBS 120 as the output signal.

The output signal path is folded to yield a compact design. In moredetail, a fold mirror 730 reflects the output signal 190 to a directionparallel to the original broadband signal 114. A sixth lens component738 focuses the light onto the entrance facet of an optical fiber 320.The fiber entrance facet is secured to the optical bench 110 via a fibermounting structure 740.

These non-laser ASE swept sources 100 are tuned over the scan band asdescribe previously with respect to the laser of FIG. 1. The ASE sourcesare 100 also at risk for PIF related failures. High optical powers arepresent at the facets of the SLED 112 and the SOA 174 along with theresonant optical filter 150. So here also dry oxygen, or other gasessuch as ozone that will react with carbon, is sealed within the hermeticpackage 500 of the swept source 100 as described previously. In oneembodiment, the oxygen content within the package is about 20%, orpreferably between 10-50%. The packages are also preferably cleaned asdescribed previously. Further, a moisture getter 430 is also applied tothe bottom of the lid of the package 500 or within the package 500. Insome examples, the getter or another getter is used to reduce hydrogenand/or volatile organics and is also applied to the lid or elsewhere inthe package 500.

The particular non-laser swept source 100 shown in FIG. 2 isillustrative. In other embodiments, other variants are used such asthose described in U.S. Pat. Appl. Publ. No. US 2011/0051143 A1, whichis incorporated herein by this reference in its entirety.

FIG. 3 shows an optical coherence analysis system 300 using the sweptsource 100, which has been constructed according to the principles ofthe present invention.

The laser or non-laser swept source 100 generates a tunable sweptoptical signal on optical fiber 320 that is transmitted tointerferometer 50. The tunable optical signal scans over a scanband witha narrowband emission.

Preferably, a k-clock module 250 is used to generate a clocking signalat equally spaced optical frequency increments as the optical signal istuned over the scan band.

In the current embodiment, a Mach-Zehnder-type interferometer 50 is usedto analyze the optical signals from the sample 340. The tunable signalfrom the source 100 is transmitted on fiber 320 to a 90/10 opticalcoupler 322. The combined tunable signal is divided by the coupler 322between a reference arm 326 and a sample arm 324 of the system.

The optical fiber of the reference arm 326 terminates at the fiberendface 328. The light exiting from the reference arm fiber endface 328is collimated by a lens 330 and then reflected by a mirror 332 to returnback, in some exemplary implementations.

The external mirror 332 has an adjustable fiber to mirror distance (seearrow 334), in one example. This distance determines the depth rangebeing imaged, i.e. the position in the sample 340 of the zero pathlength difference between the reference arm 326 and the sample arm 324.The distance is adjusted for different sampling probes and/or imagedsamples. Light returning from the reference mirror 332 is returned to areference arm circulator 342 and directed to a 50/50 fiber coupler 346.

The fiber on the sample arm 324 terminates at the sample arm probe 336.The exiting light is focused by the probe 336 onto the sample 340. Lightreturning from the sample 340 is returned to a sample arm circulator 341and directed to the 50/50 fiber coupler 346. The reference arm signaland the sample arm signal are combined in the fiber coupler 346 togenerate an interference signal. The interference signal is detected bya balanced receiver, comprising two detectors 348, at each of theoutputs of the fiber coupler 346. The electronic interference signalfrom the balanced receiver 348 is amplified by amplifier 350.

An analog to digital converter system 315 is used to sample theinterference signal output from the amplifier 350. Frequency clock andsweep trigger signals derived from the k-clock module 250 of the sweptsource 100 are used by the analog to digital converter system 315 tosynchronize system data acquisition with the frequency tuning of theswept source system 100.

Once a complete data set has been collected from the sample 340 byspatially raster scanning the focused probe beam point over the sample,in a Cartesian geometry, x-y, fashion or a cylindrical geometry theta-zfashion, and the spectral response at each one of these points isgenerated from the frequency tuning of the swept source 100, the digitalsignal processor 380 performs a Fourier transform on the data in orderto reconstruct the image and perform a 2D or 3D tomographicreconstruction of the sample 340. This information generated by thedigital signal processor 380 can then be displayed on a video monitor.

In one application, the probe is inserted into blood vessels and used toscan the inner wall of arteries and veins. In other examples, otheranalysis modalities are included in the probe such as intravascularultrasound (IVUS), forward looking IVUS (FLIVUS), high-intensity focusedultrasound (HIFU), pressure sensing wires and image guided therapeuticdevices.

While this invention has been particularly shown and described withreferences to preferred embodiments thereof, it will be understood bythose skilled in the art that various changes in form and details may bemade therein without departing from the scope of the inventionencompassed by the appended claims. For example, although the inventionhas been described in connection with an OCT or spectroscopic analysis.

What is claimed is:
 1. A swept source, comprising: a hermetic package;an optical bench within the hermetic package; a semiconductor gain chipinstalled on the optical bench for generating light; a tunable filterinstalled on the bench for filtering the light from the semiconductorgain chip to generate a swept optical signal that is swept through ascan band including a wavelength of 1060 nanometers at sweep speeds ofgreater than 5 nanometers per microsecond and has an output power ofless than 50 mW; and an atmosphere within the hermetic package thatcontains oxygen.
 2. A source as claimed in claim 1, wherein theatmosphere within the hermetic package contains at least 10% oxygen. 3.A source as claimed in claim 1, comprising a getter in the hermeticpackage.
 4. A source as claimed in claim 3, wherein the getter capturesmoisture.
 5. A source as claimed in claim 3, wherein the getter captureshydrogen or hydrocarbons.
 6. A source as claimed in claim 3, wherein thegetter is in the form of pellets.
 7. A source as claimed in claim 3,wherein the getter is applied to a lid of the hermetic package.
 8. Asource as claimed in claim 1, further comprising at least twosemiconductor gain chips installed on the bench.
 9. A source as claimedin claim 1, wherein the semiconductor gain chip is an edge emittingchip.
 10. A source as claimed in claim 1, wherein the semiconductor gainchip is a VCSEL chip.
 11. A source as claimed in claim 1, wherein thetunable filter is a resonant optical filter.
 12. A source as claimed inclaim 1, wherein the tunable filter is a MEMS Fabry-Perot tunablefilter.
 13. A source as claimed in claim 1, wherein the swept opticalsignal is received by an interferometer.
 14. A source as claimed inclaim 13, wherein a sample is placed on one arm of the interferometer.15. A source as claimed in claim 13, wherein light from a sample arm anda reference arm of the interferometer is combined and detected in orderto generate optical coherence tomography information.